Published in
American Institute of Physics, Journal of Applied Physics, 21(126), p. 213109, 2019
DOI: 10.1063/1.5134143
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Structural characterization of porous GaN distributed Bragg reflectors using x-ray diffraction
Journal article published in 2019 by
P. H. Griffin 
,
M. Frentrup,
T. Zhu ,
M. E. Vickers,
R. A. Oliver
,
M. Frentrup,
T. Zhu ,
M. E. Vickers,
R. A. Oliver
This paper was not found in any repository, but could be made available legally by the author.
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