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Nanoscale determination of phase velocity by scanning acoustic force microscopy

Journal article published in 1997 by E. Chilla, T. Hesjedal ORCID, Hj-J. Frohlich
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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Abstract

We measured the phase velocity of surface acoustic waves (SAW's) with a scanning acoustic force microscope (SAFM) and achieved a maximum lateral resolution of 19.9 nm. The phase measurement of high-frequency waves with a slowly responding SAFM cantilever was perfomed by frequency mixing at its non-linear force curve. For Au layers of different thicknesses the SAW dispersion was studied on a lateral scale of 200 nm and compared to calculated data.