Published in
2018 International Conference on Radiation Effects of Electronic Devices (ICREED), 2018
DOI: 10.1109/icreed.2018.8905103
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Charge Collection of twin well PN junction in 65 nm CMOS Inverter
Proceedings article published in 2018 by
Sui Cheng-Long,
Wang Liang,
Liu Jia-Qi,
Li Tong-De,
Shu Lei,
Wang Bi,
Li Yuan,
Cao Wei-Yi,
Zhao Yuan-Fu
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