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Published in

Institute of Electrical and Electronics Engineers, IEEE Design and Test, 3(36), p. 39-45, 2019

DOI: 10.1109/mdat.2019.2902094

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Design of 2T/Cell and 3T/Cell Nonvolatile Memories with Emerging Ferroelectric FETs

This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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