Published in
American Institute of Physics, Journal of Applied Physics, 20(126), p. 205501, 2019
DOI: 10.1063/1.5129037
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Reliability of charge carrier recombination data determined with charge extraction methods
Journal article published in 2019 by
Juliane Kniepert,
Andreas Paulke,
Lorena Perdigón-Toro 
,
Jona Kurpiers,
Huotian Zhang,
Feng Gao ,
Jun Yuan,
Yingping Zou,
Vincent M. Le Corre ,
L. Jan Anton Koster,
Dieter Neher
,
Jona Kurpiers,
Huotian Zhang,
Feng Gao ,
Jun Yuan,
Yingping Zou,
Vincent M. Le Corre ,
L. Jan Anton Koster,
Dieter Neher
This paper was not found in any repository, but could be made available legally by the author.
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