Published in
Wiley, physica status solidi (RRL) - Rapid Research Letters, 10(13), p. 1900282, 2019
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Scaling the Equivalent Oxide Thickness by Employing a TiO 2 Thin Film on a ZrO 2 –Al 2 O 3 ‐Based Dielectric for Further Scaling of Dynamic Random Access Memory
Journal article published in 2019 by
Soon Hyung Cha,
Cheol Hyun An,
Seong Tak Cho,
Dong-Gun Kim,
Dae Seon Kwon,
Jun Il Lim,
Woojin Jeon 
,
Cheol Seong Hwang
,
Cheol Seong Hwang
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