Published in
American Institute of Physics, Journal of Applied Physics, 10(125), p. 105303, 2019
DOI: 10.1063/1.5082846
Links
Tools
Investigation of stacking faults in MOVPE-grown zincblende GaN by XRD and TEM
Journal article published in 2019 by
Lok Yi Lee 
,
Martin Frentrup,
Petr Vacek,
Menno J. Kappers,
David J. Wallis ,
Rachel A. Oliver
,
Martin Frentrup,
Petr Vacek,
Menno J. Kappers,
David J. Wallis ,
Rachel A. Oliver
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Data provided by 