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American Institute of Physics, Applied Physics Letters, 6(114), p. 062901, 2019

DOI: 10.1063/1.5084060

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Detection and spatial mapping of conductive filaments in metal/oxide/metal cross-point devices using a thin photoresist layer

Journal article published in 2019 by Shimul Kanti Nath, Sanjoy Kumar Nandi ORCID, Shuai Li, Robert Glen Elliman ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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