Published in

Institute of Electrical and Electronics Engineers, IEEE Transactions on Terahertz Science & Technology, 2(9), p. 200-208, 2019

DOI: 10.1109/tthz.2019.2890971

Links

Tools

Export citation

Search in Google Scholar

THz Laser Beam Profiling by Homogeneous Photodoping of High Resistivity Silicon in a Compact Single-Pixel Detection Setup

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Green circle
Preprint: archiving allowed
Green circle
Postprint: archiving allowed
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO