Published in
Elsevier, Journal of Physics and Chemistry of Solids, 12(66), p. 2277-2280
DOI: 10.1016/j.jpcs.2005.09.050
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X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO
Journal article published in 2005 by
Christian Sternemann,
J. Aleksi Soininen,
Martin Volmer,
Achim Hohl,
Gergely Vankó,
Simone Streit-Nierobisch,
Metin Tolan
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