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IOP Publishing, Semiconductor Science and Technology, 12(34), p. 125001, 2019

DOI: 10.1088/1361-6641/ab4781

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Ultra-wide bandgap AlGaN metal oxide semiconductor heterostructure field effect transistors with high-k ALD ZrO2 dielectric

Distributing this paper is prohibited by the publisher
Distributing this paper is prohibited by the publisher

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