Published in
American Institute of Physics, Journal of Applied Physics, 24(125), p. 245304, 2019
DOI: 10.1063/1.5100310
Links
Tools
In situ TEM study of the transitions between crystalline Si and nonstoichiometric amorphous oxide under bipolar voltage bias
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Data provided by 