Published in
American Institute of Physics, Journal of Applied Physics, 24(125), p. 245703, 2019
DOI: 10.1063/1.5080289
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Nanoscale n++-p junction formation in GeOI probed by tip-enhanced Raman spectroscopy and conductive atomic force microscopy
Journal article published in 2019 by
Slawomir Prucnal 
,
Yonder Berencén ,
Mao Wang ,
Yordan M. Georgiev ,
Artur Erbe ,
Muhammad B. Khan,
Roman Boettger,
Dietrich R. T. Zahn ,
René Hübner,
Lasse Vines,
Shengqiang Zhou ,
Tommy Schönherr,
Stefan Facsko ,
Jana Kalbacova,
Martin Engler
and other authors.
,
Yonder Berencén ,
Mao Wang ,
Yordan M. Georgiev ,
Artur Erbe ,
Muhammad B. Khan,
Roman Boettger,
Dietrich R. T. Zahn ,
René Hübner,
Lasse Vines,
Shengqiang Zhou ,
Tommy Schönherr,
Stefan Facsko ,
Jana Kalbacova,
Martin Engler
and other authors.
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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