Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Nuclear Science, 7(66), p. 1427-1432, 2019
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Empirical Modeling of FinFET SEU Cross Sections Across Supply Voltage
Journal article published in 2019 by
R. C. Harrington 
,
J. S. Kauppila,
J. A. Maharrey ,
T. D. Haeffner ,
A. L. Sternberg ,
E. X. Zhang ,
D. R. Ball,
P. Nsengiyumva ,
B. L. Bhuva ,
L. W. Massengill
,
J. S. Kauppila,
J. A. Maharrey ,
T. D. Haeffner ,
A. L. Sternberg ,
E. X. Zhang ,
D. R. Ball,
P. Nsengiyumva ,
B. L. Bhuva ,
L. W. Massengill
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