Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Nuclear Science, 7(66), p. 1574-1583, 2019
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Journal article published in 2019 by
Stefano Bonaldo 
,
Simone Gerardin ,
Xiaoming Jin,
Alessandro Paccagnella,
Federico Faccio ,
Giulio Borghello ,
Daniel M. Fleetwood
,
Simone Gerardin ,
Xiaoming Jin,
Alessandro Paccagnella,
Federico Faccio ,
Giulio Borghello ,
Daniel M. Fleetwood
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