Published in
Elsevier, NDT and E International: Independent Nondestructive Testing and Evaluation, (107), p. 102147, 2019
DOI: 10.1016/j.ndteint.2019.102147
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Automated defect classification in infrared thermography based on a neural network
Journal article published in 2019 by
Yuxia Duan,
Shicai Liu,
Caiqi Hu,
Junqi Hu,
Hai Zhang 
,
Yiqian Yan,
Ning Tao,
Cunlin Zhang,
Xavier Maldague ,
Qiang Fang,
Clemente Ibarra-Castanedo ,
Dapeng Chen,
Xiaoli Li,
Jianqiao Meng
,
Yiqian Yan,
Ning Tao,
Cunlin Zhang,
Xavier Maldague ,
Qiang Fang,
Clemente Ibarra-Castanedo ,
Dapeng Chen,
Xiaoli Li,
Jianqiao Meng
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