Characterization and layer thickness mapping of two-dimensional MoS2 flakes via hyperspectral line-scanning microscopy
Journal article published in 2019 by
Xingchen Dong,
Jie Dong,
Ali K. Yetisen,
Michael H. Köhler,
Shengjia Wang 
,
Martin Jakobi,
Alexander W. Koch
,
Martin Jakobi,
Alexander W. Koch
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Published version:
archiving forbidden
Data provided by 