Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Device and Materials Reliability, 2(19), p. 452-460, 2019
DOI: 10.1109/tdmr.2019.2917138
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Assessing the Correlation Between Location and Size of Catastrophic Breakdown Events in High-K MIM Capacitors
Journal article published in 2019 by
J. Munoz-Gorriz 
,
D. Blachier,
G. Reimbold,
F. Campabadal ,
J. Sune,
S. Monaghan ,
K. Cherkaoui ,
P. K. Hurley,
E. Miranda
,
D. Blachier,
G. Reimbold,
F. Campabadal ,
J. Sune,
S. Monaghan ,
K. Cherkaoui ,
P. K. Hurley,
E. Miranda
This paper was not found in any repository, but could be made available legally by the author.
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