Published in
2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA), 2019
DOI: 10.1109/vlsi-tsa.2019.8804652
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Hot-Carrier Injection-Induced Disturb and Improvement Methods in 3D NAND Flash Memory
Proceedings article published in 2019 by
Wei-Liang Lin,
Wen-Jer Tsai,
C. C. Cheng,
Chun-Chang Lu,
S. H. Ku,
Y. W. Chang,
Guan-Wei Wu,
Lenvis Liu,
S. W. Hwang,
Tao-Cheng Lu,
Kuang-Chao Chen,
Tseung-Yuen Tseng 
,
Chih-Yuan Lu
,
Chih-Yuan Lu
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