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American Institute of Physics, Applied Physics Letters, 8(103), p. 083106

DOI: 10.1063/1.4818998

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Low Temperature Nanoscale Electronic Transport on the MoS_2 surface

Journal article published in 2013 by R. Thamankar ORCID, T. L. Yap, K. E. J. Goh, C. Troadec, C. Joachim
This paper is available in a repository.
This paper is available in a repository.

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Abstract

Two-probe electronic transport measurements on a Molybdenum Disulphide (MoS_2) surface were performed at low temperature (30K) under ultra-high vacuum conditions. Two scanning tunneling microscope tips were precisely positioned in tunneling contact to measure the surface current-voltage characteristics. The separation between the tips is controllably varied and measured using a high resolution scanning electron microscope. The MoS_2 surface shows a surface electronic gap (E_S) of 1.4eV measured at a probe separation of 50nm. Furthermore, the two- probe resistance measured outside the electronic gap shows 2D-like behavior with the two-probe separation. ; Comment: 16 pages, 3 figures