Published in

Microscopy of Semiconducting Materials 2003, p. 49-52, 2018

DOI: 10.1201/9781351074636-11

Links

Tools

Export citation

Search in Google Scholar

Electron beam illumination effects on electrostatic potential mapping in holographic imaging of semiconductors in TEM

Journal article published in 2018 by L. Houben ORCID, M. Luysberg ORCID, T. Brammer
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

Full text: Unavailable

Question mark in circle
Preprint: policy unknown
Upload
Question mark in circle
Postprint: policy unknown
Upload
Question mark in circle
Published version: policy unknown
Upload