Published in
Institute of Electrical and Electronics Engineers, IEEE Electron Device Letters, 7(40), p. 1072-1075, 2019
Links
Tools
Improving Post-Cycling Low Resistance State Retention in Resistive RAM With Combined Oxygen Vacancy and Copper Filament
Journal article published in 2019 by
Janaki Radhakrishnan 
,
Attilio Belmonte,
Sergiu Clima ,
Augusto Redolfi,
Michel Houssa ,
Gouri Sankar Kar,
Ludovic Goux
,
Attilio Belmonte,
Sergiu Clima ,
Augusto Redolfi,
Michel Houssa ,
Gouri Sankar Kar,
Ludovic Goux
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Published version:
archiving forbidden
Data provided by 