Improved Value for the Gamow-Teller Strength of the Sn100 Beta Decay

Lubos, D.; Park, J.; Faestermann, T.; Gernhäuser, R.; Krücken, R.; Lewitowicz, M.; Nishimura, S.; Sakurai, H.; Ahn, D. S.; Čeliković, I.; Baba, H.; Blank, B.; Blazhev, A.; de France, G.; Boutachkov, P.; Browne, F.; Doornenbal, P.; Fang, Y.; Fukuda, N.; Giovinazzo, J.; Goel, N.; Górska, M.; Ilieva, S.; Inabe, N.; Isobe, T.; Jungclaus, A.; Kameda, D.; Kim, Y. K.; Kojouharov, I.; Kubo, T.; Kurz, N.; Kwon, Y. K.; Lorusso, G.; Moschner, K.; Murai, D.; Nishizuka, I.; Patel, Z.; Rajabali, M. M.; Rice, S.; Schaffner, H.; Xu, Z.; Shimizu, Y.; Sinclair, L.; Söderström, P.-A.; Steiger, K.; Sumikama, T.; Suzuki, H.; Takeda, H.; Wang, Z.; Warr, N.; Watanabe, H.; Wu, Jin

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American Physical Society, Physical Review Letters, 22(122), 2019

DOI: 10.1103/physrevlett.122.222502

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Improved Value for the Gamow-Teller Strength of the Sn100 Beta Decay

Journal article published in 2019 by D. Lubos, J. Park, T. Faestermann, R. Gernhäuser, R. Krücken, M. Lewitowicz, S. Nishimura, H. Sakurai, D. S. Ahn, I. Čeliković, H. Baba

, B. Blank, A. Blazhev, G. de France, P. Boutachkov and other authors.

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Improved Value for the Gamow-Teller Strength of the Sn100 Beta Decay