Published in
American Physical Society, Physical review B, 17(99), 2019
DOI: 10.1103/physrevb.99.174432
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Surface resonance of thin films of the Heusler half-metal Co2MnSi probed by soft x-ray angular resolved photoemission spectroscopy
Journal article published in 2019 by
Christian Lidig,
Jan Minár,
Jürgen Braun,
Hubert Ebert,
Andrei Gloskovskii,
Jonas A. Krieger,
Vladimir Strocov,
Mathias Kläui,
Martin Jourdan 
This paper was not found in any repository, but could be made available legally by the author.
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