Published in

IOP Publishing, Japanese Journal of Applied Physics, SC(58), p. SCCC19, 2019

DOI: 10.7567/1347-4065/ab1393

Links

Tools

Export citation

Search in Google Scholar

Degradation processes of 280 nm high power DUV LEDs: impact on parasitic luminescence

This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

Full text: Download

Green circle
Preprint: archiving allowed
Orange circle
Postprint: archiving restricted
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO