Published in
Institute of Electrical and Electronics Engineers, IEEE Electron Device Letters, 5(40), p. 674-677, 2019
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A Dual-Point Technique for the Entire ID–VG Characterization Into Subthreshold Region Under Random Telegraph Noise Condition
Journal article published in 2019 by
Xuepeng Zhan,
Chengda Shen,
Zhigang Ji 
,
Jiezhi Chen,
Hui Fang ,
Fangbin Guo,
Jianfu Zhang
,
Jiezhi Chen,
Hui Fang ,
Fangbin Guo,
Jianfu Zhang
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