Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Nuclear Science, 3(66), p. 635-642, 2019
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A Bias-Dependent Single-Event-Enabled Compact Model for Bulk FinFET Technologies
Journal article published in 2019 by
J. S. Kauppila 
,
D. R. Ball ,
J. A. Maharrey ,
R. C. Harrington ,
T. D. Haeffner ,
A. L. Sternberg ,
M. L. Alles,
L. W. Massengill
,
D. R. Ball ,
J. A. Maharrey ,
R. C. Harrington ,
T. D. Haeffner ,
A. L. Sternberg ,
M. L. Alles,
L. W. Massengill
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