Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 4(66), p. 1789-1796, 2019
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Highly Reliable a-Si:H TFT Gate Driver With Precharging Structure for In-Cell Touch AMLCD Applications
Journal article published in 2019 by
Chih-Lung Lin 
,
Po-Cheng Lai ,
Po-Ting Lee,
Bo-Shu Chen ,
Jui-Hung Chang ,
Yu-Sheng Lin
,
Po-Cheng Lai ,
Po-Ting Lee,
Bo-Shu Chen ,
Jui-Hung Chang ,
Yu-Sheng Lin
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