Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 4(66), p. 1804-1809, 2019
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Journal article published in 2019 by
Abu Riduan Md Foisal 
,
Toan Dinh ,
Viet Thanh Nguyen,
Philip Tanner ,
Hoang-Phuong Phan ,
Tuan-Khoa Nguyen ,
Ben Haylock ,
Erik W. Streed ,
Mirko Lobino,
Dzung Viet Dao
,
Toan Dinh ,
Viet Thanh Nguyen,
Philip Tanner ,
Hoang-Phuong Phan ,
Tuan-Khoa Nguyen ,
Ben Haylock ,
Erik W. Streed ,
Mirko Lobino,
Dzung Viet Dao
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