Published in

Quantitative Phase Imaging V, 2019

DOI: 10.1117/12.2508310

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Multiple wavelength fringe analysis for surface profile measurements

Proceedings article published in 2019 by Paul Kumar Upputuri, Manojit Pramanik ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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