Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Pattern Analysis and Machine Intelligence, 7(42), p. 1654-1669, 2020
DOI: 10.1109/tpami.2019.2901875
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Adversarial Learning of Structure-Aware Fully Convolutional Networks for Landmark Localization
Journal article published in 2019 by
Yu Chen 
,
Chunhua Shen ,
Hao Chen ,
Xiu-Shen Wei ,
Lingqiao Liu,
Jian Yang
,
Chunhua Shen ,
Hao Chen ,
Xiu-Shen Wei ,
Lingqiao Liu,
Jian Yang
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