Published in
Elsevier, Acta Materialia, (167), p. 159-166, 2019
DOI: 10.1016/j.actamat.2019.01.031
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Atomic-scale structural characterization of grain boundaries in epitaxial Ge/Si microcrystals by HAADF-STEM
Journal article published in 2019 by
Yadira Arroyo Rojas Dasilva,
Rolf Erni,
Fabio Isa 
,
Giovanni Isella,
Hans von Känel,
Pierangelo Gröning ,
Marta D. Rossell
,
Giovanni Isella,
Hans von Känel,
Pierangelo Gröning ,
Marta D. Rossell
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