Published in
American Institute of Physics, Applied Physics Letters, 5(114), p. 053510, 2019
DOI: 10.1063/1.5079745
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Local trap spectroscopy on cross-sectioned AlGaN/GaN devices with in situ biasing
Journal article published in 2019 by
D. A. Gleason 
,
K. Galiano ,
J. L. Brown,
A. M. Hilton,
S. A. Ringel,
A. R. Arehart ,
E. R. Heller ,
D. L. Dorsey ,
J. P. Pelz
,
K. Galiano ,
J. L. Brown,
A. M. Hilton,
S. A. Ringel,
A. R. Arehart ,
E. R. Heller ,
D. L. Dorsey ,
J. P. Pelz
This paper was not found in any repository, but could be made available legally by the author.
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