Published in
2018 International Semiconductor Conference (CAS), 2018
DOI: 10.1109/smicnd.2018.8539769
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MOS Dosimeter Based on Ge Nanocrystals in Hfo<inf>2</inf>
Proceedings article published in 2018 by
C. Palade,
A. Slav,
A. M. Lepadatu,
I. Stavarache,
I. Dascalescu 
,
O. Cojocaru,
T. Stoica,
M. L. Ciurea,
S. Lazanu
,
O. Cojocaru,
T. Stoica,
M. L. Ciurea,
S. Lazanu
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