Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Device and Materials Reliability, 4(18), p. 490-497, 2018
DOI: 10.1109/tdmr.2018.2872562
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Probing Plasticity and Strain-Rate Effects of Indium Submicron Pillars Using Synchrotron Laue X-Ray Microdiffraction
Journal article published in 2018 by
Hashina Parveen Anwar Ali 
,
Nobumichi Tamura,
Arief Suriadi Budiman
,
Nobumichi Tamura,
Arief Suriadi Budiman
This paper was not found in any repository, but could be made available legally by the author.
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