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Journal of Material Science & Engineering, 05(07), 2018

DOI: 10.4172/2169-0022.1000482

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Investigation of Interface Diffusion in Sputter Deposited Gd0.1Ce0.9O1.95 Thin Buffer Layers on Y-Stabilized Zirconia Crystalline Substrates for Solid Oxide Cells Applications

Journal article published in 2018 by Nunzia Coppola, Giovanni Carapella ORCID, Chiara Sacco ORCID, Pasquale Orgiani, Alice Galdi, Pierpaolo Polverino ORCID, Alberto Ubaldini, Luigi Maritato, Cesare Pianese
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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