Published in
Elsevier, Microelectronics Reliability, (88-90), p. 864-867, 2018
DOI: 10.1016/j.microrel.2018.06.055
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Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes
Journal article published in 2018 by
D. Monti 
,
M. Meneghini ,
C. De Santi,
A. Bojarska ,
P. Perlin,
G. Meneghesso,
E. Zanoni
,
M. Meneghini ,
C. De Santi,
A. Bojarska ,
P. Perlin,
G. Meneghesso,
E. Zanoni
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