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Frontiers in Optics / Laser Science, 2018

DOI: 10.1364/fio.2018.jw4a.126

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Weak-measurement-enhanced Metrology in the Presence of CCD Noise and Saturation

Proceedings article published in 2018 by Liang Xu, Zexuan Liu, Lijian Zhang
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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