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American Chemical Society, Journal of the American Chemical Society, 39(140), p. 12501-12510, 2018

DOI: 10.1021/jacs.8b06395

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Synergistic Boron Doping of Semiconductor and Dielectric Layers for High-Performance Metal Oxide Transistors: Interplay of Experiment and Theory

Journal article published in 2018 by Xinan Zhang, Binghao Wang ORCID, Wei Huang ORCID, Yao Chen ORCID, Gang Wang, Li Zeng ORCID, Weigang Zhu ORCID, Michael J. Bedzyk ORCID, Weifeng Zhang, Julia E. Medvedeva, Antonio Facchetti ORCID, Tobin J. Marks ORCID
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Distributing this paper is prohibited by the publisher

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