Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, p. 1-8, 2018
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Variability Study of MWCNT Local Interconnects Considering Defects and Contact Resistances--Part II: Impact of Charge Transfer Doping
Journal article published in 2018 by
Rongmei Chen 
,
Jie Liang ,
Jaehyun Lee ,
Vihar P. Georgiev ,
Raphael Ramos ,
Hanako Okuno,
Dipankar Kalita,
Yuanqing Cheng,
Liuyang Zhang ,
Reetu R. Pandey,
Salvatore Amoroso,
Campbell Millar,
Asen Asenov,
Jean Dijon,
Aida Todri-Sanial
,
Jie Liang ,
Jaehyun Lee ,
Vihar P. Georgiev ,
Raphael Ramos ,
Hanako Okuno,
Dipankar Kalita,
Yuanqing Cheng,
Liuyang Zhang ,
Reetu R. Pandey,
Salvatore Amoroso,
Campbell Millar,
Asen Asenov,
Jean Dijon,
Aida Todri-Sanial
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