Published in
American Institute of Physics, Applied Physics Letters, 10(109), p. 102106
DOI: 10.1063/1.4962538
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Band alignment of Ga2O3/Si heterojunction interface measured by X-ray photoelectron spectroscopy
Journal article published in 2016 by
Zhengwei Chen,
Kazuo Nishihagi,
Xu Wang,
Katsuhiko Saito,
Tooru Tanaka,
Mitsuhiro Nishio,
Makoto Arita,
Qixin Guo 
This paper was not found in any repository, but could be made available legally by the author.
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