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Wiley, Advanced Electronic Materials, 1(4), p. 1700458, 2017

DOI: 10.1002/aelm.201700458

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Processes and Effects of Oxygen and Moisture in Resistively Switching TaO<sub>x</sub> and HfO<sub>x</sub>

Journal article published in 2017 by Michael Lübben ORCID, Stefan Wiefels ORCID, Rainer Waser ORCID, Ilia Valov ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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