Published in

Optica, Optics Express, 19(26), p. 24953, 2018

DOI: 10.1364/oe.26.024953

Links

Tools

Export citation

Search in Google Scholar

Real-time monitoring and gradient feedback enable accurate trimming of ion-implanted silicon photonic devices

This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

Full text: Download

Red circle
Preprint: archiving forbidden
Green circle
Postprint: archiving allowed
Green circle
Published version: archiving allowed
Data provided by SHERPA/RoMEO