Identification of interfacial defects in a Ge gate stack based on ozone passivation
Journal article published in 2018 by
Lixing Zhou 
,
Xiaolei Wang,
Xueli Ma,
Kai Han,
Yanrong Wang,
Jinjuan Xiang,
Hong Yang,
Jing Zhang,
Chao Zhao,
Tianchun Ye ,
Wenwu Wang
,
Xiaolei Wang,
Xueli Ma,
Kai Han,
Yanrong Wang,
Jinjuan Xiang,
Hong Yang,
Jing Zhang,
Chao Zhao,
Tianchun Ye ,
Wenwu Wang
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