Published in
Institute of Electrical and Electronics Engineers, IEEE Access, (6), p. 43079-43087, 2018
DOI: 10.1109/access.2018.2862162
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A Simple Test to Check the Inherent-Stability Proviso on Field-Effect Transistors
Journal article published in 2018 by
Sergio Colangeli 
,
Rocco Giofre ,
Walter Ciccognani ,
Ernesto Limiti
,
Rocco Giofre ,
Walter Ciccognani ,
Ernesto Limiti
This paper is made freely available by the publisher.
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