Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Nuclear Science, 8(65), p. 1951-1955, 2018
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Single-Event Burnout Mechanisms in SiC Power MOSFETs
Journal article published in 2018 by
Arthur F. Witulski 
,
Dennis R. Ball ,
Kenneth F. Galloway,
Arto Javanainen ,
Jean-Marie Lauenstein,
Andrew L. Sternberg,
Ronald D. Schrimpf
,
Dennis R. Ball ,
Kenneth F. Galloway,
Arto Javanainen ,
Jean-Marie Lauenstein,
Andrew L. Sternberg,
Ronald D. Schrimpf
This paper was not found in any repository, but could be made available legally by the author.
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