Published in
Elsevier, Microelectronic Engineering, (178), p. 250-253
DOI: 10.1016/j.mee.2017.05.028
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Electron transport across ultrathin ferroelectric Hf0.5Zr0.5O2 films on Si
Journal article published in 2017 by
A. Chouprik 
,
A. Chernikova,
A. Markeev,
V. Mikheev,
D. Negrov,
M. Spiridonov,
S. Zarubin,
A. Zenkevich
,
A. Chernikova,
A. Markeev,
V. Mikheev,
D. Negrov,
M. Spiridonov,
S. Zarubin,
A. Zenkevich
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