Published in
Elsevier, Microelectronics Reliability, (83), p. 198-205
DOI: 10.1016/j.microrel.2018.02.013
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Study of electrochemical migration based transport kinetics of metal ions in Sn-9Zn alloy
Journal article published in 2018 by
Haoran Ma,
Anil Kunwar 
,
Jun Chen,
Lin Qu,
Yunpeng Wang,
Xueguan Song,
Peter Råback,
Haitao Ma ,
Ning Zhao
,
Jun Chen,
Lin Qu,
Yunpeng Wang,
Xueguan Song,
Peter Råback,
Haitao Ma ,
Ning Zhao
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