Published in
Elsevier, Thin Solid Films, (629), p. 97-102
DOI: 10.1016/j.tsf.2017.03.024
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Oxygen diffusion in TiO 2 films studied by electron and ion Rutherford backscattering
Journal article published in 2017 by
G. G. Marmitt 
,
S. K. Nandi,
D. K. Venkatachalam,
R. G. Elliman ,
M. Vos,
P. L. Grande
,
S. K. Nandi,
D. K. Venkatachalam,
R. G. Elliman ,
M. Vos,
P. L. Grande
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