Published in
Elsevier, Microelectronic Engineering, (178), p. 199-203, 2017
DOI: 10.1016/j.mee.2017.05.019
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Analysis of border and interfacial traps in ALD-Y2O3 and -Al2O3 on GaAs via electrical responses - A comparative study
Journal article published in 2017 by
T. W. Chang,
K. Y. Lin,
Y. H. Lin 
,
L. B. Young,
J. Kwo,
M. Hong
,
L. B. Young,
J. Kwo,
M. Hong
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